scitechdaily | To fabricate single-atom and few-atom transistors, the team relied on
a known technique in which a silicon chip is covered with a layer of
hydrogen atoms, which readily bind to silicon. The fine tip of a
scanning tunneling microscope then removed hydrogen atoms at selected
sites. The remaining hydrogen acted as a barrier so that when the team
directed phosphine gas (PH3) at the silicon surface, individual PH3 molecules
attached only to the locations where the hydrogen had been removed (see
animation). The researchers then heated the silicon surface. The heat
ejected hydrogen atoms from the PH3 and caused the phosphorus
atom that was left behind to embed itself in the surface. With
additional processing, bound phosphorous atoms created the foundation of
a series of highly stable single- or few-atom devices that have the
potential to serve as qubits.
Two of the steps in the method devised by the NIST teams — sealing
the phosphorus atoms with protective layers of silicon and then making
electrical contact with the embedded atoms — appear to have been
essential to reliably fabricate many copies of atomically precise
devices, NIST researcher Richard Silver said.
In the past, researchers have typically applied heat as all the
silicon layers are grown, in order to remove defects and ensure that the
silicon has the pure crystalline structure required to integrate the
single-atom devices with conventional silicon-chip electrical
components. But the NIST scientists found that such heating could
dislodge the bound phosphorus atoms and potentially disrupt the
structure of the atomic-scale devices. Instead, the team deposited the
first several silicon layers at room temperature, allowing the
phosphorus atoms to stay put. Only when subsequent layers were deposited
did the team apply heat.
“We believe our method of applying the layers provides more stable
and precise atomic-scale devices,” said Silver. Having even a single
atom out of place can alter the conductivity and other properties of
electrical components that feature single or small clusters of atoms.
The team also developed a novel technique for the crucial step of
making electrical contact with the buried atoms so that they can operate
as part of a circuit. The NIST scientists gently heated a layer of
palladium metal applied to specific regions on the silicon surface that
resided directly above selected components of the silicon-embedded
device. The heated palladium reacted with the silicon to form an
electrically conducting alloy called palladium silicide, which naturally penetrated through the silicon and made contact with the phosphorus atoms.
In a recent edition of Advanced Functional Materials, Silver
and his colleagues, who include Xiqiao Wang, Jonathan Wyrick, Michael
Stewart Jr. and Curt Richter, emphasized that their contact method has a
nearly 100% success rate. That’s a key achievement, noted Wyrick. “You
can have the best single-atom-transistor device in the world, but if you
can’t make contact with it, it’s useless,” he said.
Fabricating single-atom transistors “is a difficult and complicated
process that maybe everyone has to cut their teeth on, but we’ve laid
out the steps so that other teams don’t have to proceed by trial and
error,” said Richter.
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